陳恆生(Hansen Chen's Resume)
(1) 學歷 (Education Background) :
國立臺灣大學 材料科學與工程學系暨研究所 碩士 (1986~1988)
Master, Institute of Materials Science and Engineering, National Taiwan University (1986-1988)
國立清華大學 材料科學工程學系 學士 (1982~1986)
Bachelor, Department of Materials Science and Engineering, National Tsing Hua University (1982-1986)
(2) 經歷 (Experience) :
科誠(科技)有限公司 業務副總 (From 2005)
Technology Bridge Co.,LTD. VP of sales.
科榮股份有限公司 協理 (From 1997 till 2005)
Scientek Corporation, Sales (From1990)
Scientek Corporation, Director (From 1997)
Director of Agent Business Division and Department leader of Group 4.
Director of Market Development Division
Director of Agent Business Division and Division Sales leader.
國立臺灣大學 材料科學與工程學系暨研究所 系友會理事 (2002~Now)
Councilor of Alumnus association of Institute of Materials Science and Engineering, National Taiwan University (2002~Now)
非游離輻射操作人員執照
Operation license for non-ionization radiation equipment, Atomic Energy Commission (AEC), ROC.
(3) 經驗 (Experience) :
從事分析儀器及設備之銷售及技術服務超過15年.客戶遍及研究單位,各大學院校,半導體業,平面顯示器業,精密粉末工業,化工業等.領導之技術團體,提供奈米,薄膜,表面科學分析與技術之服務.並已擴展業務至大陸地區.相關經驗如下:
Dedicated for Instrument & Equipments technical market over 15 years from 1990. Major field cover R&D unit, University, Semiconductor-Metrology/Failure Analysis, Flat panel display, fine powder, chemistry engineering industries…. Provide analysis and technical supporting for Nano technology, thin film and surface science field by a technical team including Taiwan and China territory.
Relative experience as follow
3.1 掃描式探針顯微鏡(Scanning Probe Microscope) From 1993.
已銷售超過200台各式掃描式探針顯微鏡. Sell over 200 SPMs.
代理過相關掃描式探針顯微鏡產品如下(SPM product experience) :
Veeco : DI, Topometrixs, PSI...SPM family.
Unisoku : Ultra low temperature, ultra high vacuum, variable magnetic SPM.
RHK : UHV SPM/STM/AFM.
Hysitron : Nanomechanical behavior measurement.
Nano Instrument (MTS) : Nano mechanical test.
3rdTech : Nanomapulation interface.
nPoint : Capacitance close loop stage/system, Nano Carbon Tube SPM tip.
Multiprobe : multi probe scanning force probing for electrical application. Can add up to 5 probes.
Sutter : Optical fiber puller for NSOM tip application.
Silicon-MDT (Mikromasch) : SPM tips and grating.
Others : Nanotechnology SPM related platform.
3.2 X-ray繞射儀(XRD) X-ray螢光分析儀(XRF), 全反射螢光分析儀(TXRF),繞射儀(XRD), From 1992
代理過相關X-ray產品如下 (X-ray product experience) :
Rigaku : XRF for film thickness and composition measurement
TXRF for surface contamination measurement
XRR for ultra thin film thickness, density, interface roughness and pore size measurement
SAXS for pore size distribution.
GXR for XRF/XRR/XRD/SAXS combination system
Scientag (Thermal group) : powder and thin film XRD.
Spectrace (Thermal Group) : EDXRF.
AXIC : Bench top EDXRF\WDXRF.
3.3橢圓儀(Ellipsometer), From 1998.
代理過相關產品如下 (Optical and Ellipsometer product experience) :
Jobin Yvon : Multi wavelength Spectroscopic Ellipsometer
Jobin Yvon : Single wavelength laser Spectroscopic Ellipsometer (Philips before)
Horiba : On line TFT and 300mm full automatic Spectroscopic Ellipsometer
Horiba : On line 300mm Auto Raman spectrometer for Epi wafer SiGe film stress measurement.
3.4表面分析儀 (Surface analysis instrument) : 代理過相關產品如下 (Surface analysis product experience) :
VG-S : AES/ESCA/Angle resolution AES. UHV Chamber, source, detector..
CAMECA : Dynamic SIMS, NanoSIMS, LEXES for low implanting measurement
3.5材料粉末分析儀 ( Powder and Particle size analyzer) : 代理過相關產品如下 (product experience) :
Micrometricits : Surface area, Particle size, Pore size and Density analyzer,
PSS : Dynamic Laser Scattering Nano Particle size analyzer.
MSP : Nano particle deposition and sizing system
3.6設備 (Equipments) : 目前過相關產品如下 (product experience) :
VG-Semicon : MBE, SiGe HVCVD.
OIPT : RIE, PECVD, IBD equipment.
Cenntor/VI : Ultra high temperature and vacuum furnace.
Astro/Brew : Ultra high temperature and vacuum furnace.
Harper : Precious gas control high temperature furnace for Powder application.
IDE : Active and Passive vibration-proof system and EMI (EM isolation system)
Vibration/Acoustic/EM noise site survey.
3.7 其它相關技術產品 (Other Technical product experience)
Semitest : Surface charge analyzer.
Metryx Mentor : On Line Low K density and film deposition/etching thickness monitor for Semiconductor.
PVA-Tepla : TWIN for wide range 10e12~10e16 dose monitor. SIRD for wafer bulk stress measurement.
LA-Wave : Film surface mechanical behavior measurement.
Control semiconductor : FATCAT-Laser layer by layer dry IC decap system with LIBS
(Laser Induced Breakdown Spectrometer).
Hypervision : Emission Microscope for Semiconductor FA application.
Oxford Instrument : Superconductor magnetic and ultra low temperature sample holder.
Process tube : Integrated O2, Moisture, and particle size measurement system.
Quantomix : Wet SEM sample capsule to see alive sample under SEM.
Nano System : Optical profiler.
(4) 發表及演講 (Publish and Speech) :
4.1金屬粉末射出成型真空一次脫蠟燒結法,粉末冶金月刊.
Metal Injection Molding, One step Vacuum de-wax sintering process, Powder metallurgy monthly.
4.2 AFM(SPM)在半導體工業之應用,第三屆毫微米元件技術研討會演講,1996年5月.國科會國家毫微米元件實驗室.
AFM(SPM) application on Semiconductor industry, The third symposium on Nano device technology. National Nano Device Laboratory (NDL), Semiconductor center of NCTU, The Electronics Devices and Materials Association, Union Chemical Laboratories (UCL) of ITRI.
4.3原子力顯微鏡在生化科學之應用研討會演講,1997年6月.國科會精密儀器發展中心.
AFM on Bio-science application conference, 1997/6, Precision Instrument Development Center (PIDC).
4.4 SPM在半導體工業之運用與實例,量測資訊57期,1997年9月.與衣冠君博士(先前任職於茂德科技,現任職中芯半導體)合著.
SPM application example on Semiconductor industry, No.57 of Measurement information of Center for Measurement Standards (CMS) of ITRI.
4.5掃描式電容顯微鏡(Scanning Capacitance Microscope,SCM), 1998年9月.國科會精密儀器發展中心出版,儀器總覽5材料分析儀器P.50~P.53.與許朝雄(先前任職於科榮股份有限公司,現任職FEI公司)合著.
Scanning Capacitance Microscope, SCM. 1998/9. Introduction to Instrumentation, Part 5, material analysis, Precision Instrument Development Center (PIDC).
4.6磁力顯微鏡(Magnetic Force Microscope, MFM), 1998年9月.國科會精密儀器發展中心出版,儀器總覽5材料分析儀器P.54~P.55.與許朝雄(先前任職於科榮股份有限公司,現任職FEI公司)合著
Magnetic Force Microscope, MFM. 1998/9. Introduction to Instrumentation, Part 5, material analysis, Precision Instrument Development Center (PIDC).
4.7電力顯微鏡(Electric Force Microscope, EFM), 1998年9月.國科會精密儀器發展中心出版,儀器總覽5材料分析儀器P.56~P.58.與許朝雄(先前任職於科榮股份有限公司,現任職FEI公司)合著.
Electric Force Microscope, EFM. Introduction to Instrumentation, Part 5, material analysis, Precision Instrument Development Center (PIDC).
4.8掃描式探針顯微鏡之發展及應用,1998年10月.中華民國電子顯微鏡學會,第19屆學術研討會演講.
SPM development and it’s application, 1998/10,The 19th academic conference, The ROC electrical microscopy association.
4.9半導體儀器分析介紹,1999年,中山大學半導體推廣課程演講.
Semiconductor instrument analysis introduction, 1999. Semiconductor research center. National Sun Yat-Sen University.
4.10 X光螢光光譜儀之應用,量測資訊66期,1999年3月.與林勇志(先前任職科榮股份有限公司,現任職科誠有限公司,中國分公司)合著.
X-ray fluorescence spectrometer application. No.57 of Measurement information of Center for Measurement Standards (CMS) of ITRI. (Co-author, Lawrence Lin working as TBCL China area sales manager).
4.11 SPM Basic and it’s application on Biological,2002年FOM 2002 international conference. 中山大學演講.
SPM Basic and it’s application on Biological, FOM2002 international conference, National Sun Yat-Sen University.
4.12 NanoTechnology Trend and Its Future,2002年11月.臺灣大學 材料科學與工程學系暨研究所20週年慶演講.
NanoTechnology Trend and Its Future-Speech,November,2002, The 20th annual celebration of Institute of Materials Science and Engineering, National Taiwan University
4.13多功能原子力顯微鏡-演講, 2003/7/11,台灣聯合大學系統(中央大學,交通大學,清華大學,陽明大學)-奈米科技研究中心.
The multi mode SPM introduction. 2003/7/11, Nanotechnology research center, University System of Taiwan. (National Central University, National Chiao Tung University, National Tsing Hua University, National Yang Ming University).
4.14 掃描式探針顯微鏡-講師, 2003/8/26, 經濟部工業局九十二年度化學工業科技人才培訓計畫-化學工業分析技術人才培訓計畫,奈米材料分析技術研習班.財團法人成大研究發展基金會.
SPM introduction, 2003/8/26, Industrial Development Bureau Ministry of Economic Affairs, 2003 Chemical industries engineer training program-Chemical industry analysis personal training project, Nano Material analysis technical class. NCKU (National Cheng Kuan University) Research and Development Foundation.
4.15 2003高解析多功能掃描式探針顯微鏡說明會, 2003/12/05,逢甲大學研發處－共同貴重儀器中心、奈米科技研發中心.科榮股份有限公司，逢甲大學研發處－創新育成中心、技術授權中心.
2003 high resolution multi mode SPM, 2003/12/5, Feng Chia University, Precision Instrument support Center, Nanotechnology research center, Office of Technology Licensing, Business Incubation Center. Scientek Corporation.
4.16 SPM原理操作與應用-演講, 2003/12/20, 國立中正大學奈米科技學程中心,教育部中南區奈米人才培育聯盟,中正大學光機電整合工程研究所,中正大學光機械學系.
SPM basic theory, operation and application, 2003/12/20,National Chung Cheng University, Center for the Nanotechnology Design & Prototyping, Graduate Institute of Opto-Mechatronics, Department of Mechanical Engineering. Nano-technology personal training for the center Taiwan region.
4.17 SPM家族介紹及其在奈米領域之應用,No.5. March 2004.經濟部技術處,產業奈米技術應用促進會-產業奈米技術應用資訊園地-產業應用專刊.
SPM family introduction and their application on Nanotechnology. No.5. March,2004. Department of Industrial Technology, Ministry of Economic Affairs, R.O.C. Industries Nanotechnology application Promotion association.
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